Bench top particle analysis

JOHN Morris has released a high resolution laser particle sizer, with an optical measuring cell for increased sample resolution

JOHN Morris has released a high resolution laser particle sizer, with an optical measuring cell for increased sample resolution.

Four models are available in the range; the Compact, NanoTec, MicroTec and MicroTec XT.

The Compact is the standard model, with a measuring range from 0.3 to 300 µm.

The Compact is said to be suitable for bench top particle size analysis in a laboratory, or in production.

The NanoTec, taking into consideration backward scattering, is capable of 0.01 µm measurements, with a total measurement range from 0.01 to 1000 µm.

The measurement range can be switched to 15 µm to 2000 µm through beam expansion.

The MicroTec model has a smaller measuring range, with a lower measurement limit of 0.1 µm.

The MicroTec XT has an upper measuring range of 2000 µm.

Key contact:

Joe Dahdah

John Morris Scientific

info@johnmorris.com.au

www.johnmorris.com.au

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